NATW 2006 - Call for Papers

CALL FOR PAPERS

Scope

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient testing methodologies and designs. The 15th workshop will feature "Testing in the high frequency world". The major topics include, but are not limited to, the following:

Analog/Mixed Signal Testing
Built-In Self-Test (BIST)
Board Level Testing
Delay/Performance Testing
Design Verification/Validation
Diagnosis and Debug
Embedded Core Testing
Fault Modeling/Simulation
IDDQ Testing
Multi-Chip Module Testing
Memory Testing
MEMS Testing
Online Testing
RF Testing
System-on-Chip (SoC) Test
Test Quality/System Reliability
Test Resource Partitioning
Testing for Soft Defects

Author Information

top

The Program Committee invites authors to submit original, unpublished paper and panel proposals. Submissions may be in terms of extended summaries or full papers.

Best Student Presentation Award

To encourage student participation in the research community, we will have sessions dedicated to student presentations and present a Best Student Presentation Award. We feel that it is important to integrate students into the research community early in their careers so that they can experience the excitement of direct interaction with their peers.

Important Dates:

Submission of papers - 2/20/06
Notification of paper acceptance - 3/30/06
Submission of camera-ready papers - 4/10/06

For general information, contact:

Dr. Peilin Song, General Chair
IBM T. J. Watson Research Center
1101 Kitchawan Road, Route 134
Yorktown Heights, NY 10598
Phone: 914-945-3990
FAX: 914-945-4329
Email: psong@us.ibm.com

Submit paper proposals to:

Dr. Sule Ozev, Program Chair
Duke University
ECE Department, Box 90291
Durham, NC 27708
Phone: 919-660-5273
FAX: 919-660-5293
Email: sule@ee.duke.edu

For more information, visit us on the web at: http://www.ee.duke.edu/NATW/

The 15th IEEE North Atlantic Test Workshop (NATW 2006) is sponsored, in part, by the Institute of Electrical and Electronics Engineers (IEEE) VT Section and the IEEE Computer Society's Test Technology Technical Council (TTTC).

CALL FOR PAPERS
Scope -- Author Information
Scope
The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient testing methodologies and designs. The 15th workshop will feature "Testing in the high frequency world". The major topics include, but are not limited to, the following: Analog/Mixed Signal Testing Built-In Self-Test (BIST) Board Level Testing Delay/Performance Testing Design Verification/Validation Diagnosis and Debug Embedded Core Testing Fault Modeling/Simulation IDDQ Testing Multi-Chip Module Testing Memory Testing MEMS Testing Online Testing RF Testing System-on-Chip (SoC) Test Test Quality/System Reliability Test Resource Partitioning Testing for Soft Defects
Author Information	top
The Program Committee invites authors to submit original, unpublished paper and panel proposals. Submissions may be in terms of extended summaries or full papers. Best Student Presentation Award To encourage student participation in the research community, we will have sessions dedicated to student presentations and present a Best Student Presentation Award. We feel that it is important to integrate students into the research community early in their careers so that they can experience the excitement of direct interaction with their peers. Important Dates: Submission of papers - 2/20/06 Notification of paper acceptance - 3/30/06 Submission of camera-ready papers - 4/10/06 For general information, contact: Dr. Peilin Song, General Chair IBM T. J. Watson Research Center 1101 Kitchawan Road, Route 134 Yorktown Heights, NY 10598 Phone: 914-945-3990 FAX: 914-945-4329 Email: psong@us.ibm.com Submit paper proposals to: Dr. Sule Ozev, Program Chair Duke University ECE Department, Box 90291 Durham, NC 27708 Phone: 919-660-5273 FAX: 919-660-5293 Email: sule@ee.duke.edu
For more information, visit us on the web at: http://www.ee.duke.edu/NATW/
The 15th IEEE North Atlantic Test Workshop (NATW 2006) is sponsored, in part, by the Institute of Electrical and Electronics Engineers (IEEE) VT Section and the IEEE Computer Society's Test Technology Technical Council (TTTC).